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A system called Micro LED PL inspection is used to inspect micro-LEDs on wafers at high speeds to look for abnormalities in their external appearance, light emission intensity, and wavelength.
This inspection system makes use of a photoluminescence (PL) measurement method that is based on cutting-edge image processing technology and a brand-new imaging module that was developed with a technology for unique optical design.
They are known as the “MiNYTM PL” micro-LED PL inspection system.
They are referred to as the “MiNYTM PL” micro-LED PL inspection system. When inspecting micro-LEDs, the MiNYTM PL makes quick pass/fail decisions, which will increase product yield for display applications and improve micro-LED R&D efficiency.
By capturing and analyzing light-excited photoluminescence images in a non-contact and non-invasive manner, the PL measurement technique is a versatile method for evaluating the characteristics of LEDs and other devices.
In comparison to their predecessors, micro LED PL displays are more energy efficient and have a higher contrast and brightness.
At CES and Display Week, functional prototypes for watches, augmented reality glasses, televisions, signage, and automotive displays were displayed.
Now, vendors are focusing on increasing yield and productivity for all process steps rather than just getting prototypes out the door, which should cut costs significantly.
The Global Micro LED PL inspection system market accounted for $XX Billion in 2022 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2023 to 2030.
Hamamatsu photonics – For next-generation displays, Hamamatsu Photonics has developed a system that can quickly and completely inspect micro-LEDs to identify abnormalities in their external appearance, light emission intensity, and wavelength.
Inziv Micro LED – Tests microLED wafers with automated PL and EL in 1 integrated platform. No need for multiple systems – InZiv’s OmniPix 2.0 offers both critical testing modes in 1 system.
Micro LED PL testing demands a full set of measurements for maximum quality assurance. Easily obtain the most critical data for your micro LED PL inspection protocols.
With pixels currently being developed on a scale as small as single-microns, only the highest resolution techniques – down to the nanoscale – can meet today’s most rigorous characterization demands.
