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INTRODUCTION OF AFM-RAMAN MARKET
AFM and tip-enhanced Raman spectroscopy are combined in Raman atomic force microscopy (AFM) (TERS). They are both employed in chemical imaging. AFM-Raman uses confocal microscopy to record co-located Raman spectra while simultaneously utilising AFM to map the surface shape with few-nanometer spatial resolution. This enables Raman spectroscopy-based chemical imaging with a few hundred nm spatial resolution.
TERS is utilised for chemical imaging with a spatial resolution of a few nanometers. This depends on signal amplification caused by a metallic surface’s contact with a metallic AFM tip. TERS is used to monitor chemical reactions in-situ and can be carried out in liquid environments.
Topography, conductivity, and temperature measurements are only a few of the nanometric characterizations offered by atomic force microscopy (AFM). AFM is quite good at measuring some things, but it can’t tell what a material is made of chemically.
Nonetheless, Raman spectroscopy has become a vital tool in chemical characterization, properly identifying and categorising materials in a wide range of sectors and businesses, including semiconductors, chemistry, biology, and many more.
AFM-RAMAN MARKET SIZE AND FORECAST
The Global AFM-Raman Market accounted for $XX Billion in 2022 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2024 to 2030.
AFM-RAMAN MARKET NEW PRODUCT LAUNCH
The AFM platform enables not only entirely co-localized AFM-Raman measurements but also fully integrated usage of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)).
Any laser source in the Raman spectrometer can be used to analyse topographical, electrical, and mechanical properties, as well as a variety of additional AFM (Atomic Force Microscope) techniques (e.g., solar simulator or other tunable or continuum source).
In order to make the AFM-Raman platform a two-way street where complementary techniques contribute novel and distinctive imaging capabilities to one another, TERS and TEPL can deliver nanoscale chemical and structural information.
The Icon AFM-Raman system combines the complementary atomic force microscopy and Raman microscopy techniques to offer vital details on a sample’s topography and chemical makeup.
Researchers are better able to comprehend the processes that result in particular material properties when these techniques are further improved with advanced AFM modes, such as PeakForce TUNA electrical characterization and PeakForce QNM® quantitative nanomechanical mapping, which are exclusive to Bruker.
AFM-RAMAN MARKET COMPANY PROFILE
AFM-RAMAN MARKET THIS REPORT WILL ANSWER FOLLOWING QUESTIONS
