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The bending of electron beams around atomic structures is referred to as electron diffraction. Due to the wave-particle duality, which states that electrons exhibit both particle- and wave-like behaviour, this behaviour, which is common for waves, is applied to electrons.
Since the diffracted beams interfere, they produce diffraction patterns that are frequently employed for investigation of the diffraction-causing objects.
Therefore, derived experimental methods utilised for material characterization can also be referred to as electron diffraction. This method is comparable to neutron and X-ray diffraction.
The most popular method for studying crystalline, quasi-crystalline, and amorphous materials with electron microscopes is electron diffraction.
Electrons are accelerated by an electric potential in these devices to increase their energy and reduce their wavelength.
From nano-crystalline materials that are currently difficult or impossible to crystallise or, due to their nature and size, cannot be crystallised by conventional methods, the diffractometer immediately identifies hitherto insoluble structures.
The global Electron Diffractometer market accounted for $XX Billion in 2022 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2023 to 2030.
The XtaLAB Synergy-ED, an integrated electron diffraction platform for the determination of molecular structures from nanocrystals, is the result of a joint project between Rigaku Corporation, a leading manufacturer of X-ray analysis instruments, and JEOL Ltd., a leading manufacturer of electron microscopes and other analytical instruments.
A brand-new electron diffractometer called XtaLAB Synergy-ED offers a completely integrated workflow from data collection to three-dimensional molecular structure determination.
The XtaLAB Synergy-ED is the outcome of a creative partnership to synergistically combine our core technologies: JOEL’s extensive experience and market dominance in designing and manufacturing transmission electron microscopes, Rigaku’s high-speed, high-sensitivity photon-counting detector (HyPix-ED), and cutting-edge instrument control and single crystal analysis software platform (CrysAlisPro for ED).
The primary benefit of this product is that it gives researchers access to an integrated platform that makes electron crystallography simple to use.
Any X-ray crystallographer can use the XtaLAB Synergy-ED system without needing to become an expert in electron microscopy.
In the domains of drug discovery, synthetic chemistry, and material science, one important tool for fostering creativity is the determination of 3D molecular structures at the atomic level.
For a very long time, the main method for accurately determining the 3D molecular structures of inorganic, organic, and protein molecules was single crystal X-ray structural analysis.
