Laser line scanners are being used to make digital copies of items, which are typically freeform. When compared to conventional touch probing, optical systems have a higher data rate, which makes this technology ideal for gathering the large number of measurement points needed to sample complex (non-prismatic) geometrical structures.
Laser line scanners have advanced to the point that they can now be used in place of tactile inspection of geometrical primitives. With advances in resolution, optics quality, image processing, and data analysis, laser line scanning is now a productive alternative to tactile measures, even for feature inspection, that is still adequately precise.
The global laser scanning probes market accounted for $XX Billion in 2023 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2024 to 2030.
The AFM100 Pro High-Sensitivity Scanning Probe Microscope System, a high-end scanning probe microscope with a newly developed high-sensitivity optical head that improves sensitivity when measuring physical properties and enables measurement at atomic and molecular scales, was just released, according to Hitachi High-Tech Corporation (“Hitachi High-Tech”).
The creation of highly sensitive measuring and analysis equipment is widely desired in the field of research and development of advanced functional materials. The AFM100 Pro satisfies the need for on-site analysis and will help with client problem-solving.
AFM is a kind of measurement and analysis tool that uses a probe with a tip that is only a few nanometers*3 in diameter to scan the surface of a material. AFM is capable of performing physical property assessments while simultaneously seeing a sample surface at the nanoscale.
AFM is utilized in quality control and research and development in a variety of industries, including semiconductor, polymer, and biomedical. Hitachi High-Tech offers a wide selection of user-friendly AFM devices, and by streamlining the AFM measurement process and avoiding operator-caused data variations, it has been steadily increasing the reliability of these devices.
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