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The study of measurements made using light is known as optical metrology. These measurements can focus on either the characteristics of light and light sources or the characteristics of things, such as their sizes, distances, and temperatures.
Since measured properties of light are frequently utilized for other purposes in addition to characterizing a light source, there is no clear distinction between both fields. For instance, optical frequency metrology is used to create extremely accurate optical clocks, blurring the line between them.
The Global optical metrology system market accounted for $XX Billion in 2023 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2024 to 2030.
New optical metrology equipment for expansive areas has been launched by Sens far Metrology. A high-performance, non-contact, three-dimensional optical big area metrology device with sophisticated inspection and analysis capabilities, the Sens far S wide is designed for micro-scale measurement.
In order to quickly measure large sample areas up to 300 × 300 mm (11.8 x 11.8 in), S broad is a specialized solution.
It offers all the advantages of a digital microscope built into a high-resolution measuring device. It is very user-friendly, with data gathering at the touch of a button. Without restrictions, the Sens far S broad is perfect for all scientific settings and works well as a metrology sensor in manufacturing domains. To give precise and traceable measurements, S wide is manufactured.
The ISO 25178 and VDI 2634-2 standards are used for system calibration and traceability. Senso VIEW, a new piece of software that can be used for a variety of analytic jobs, is paired with Sens Oscan, the system’s driver, to provide a clear, simple, and user-friendly interface for S wide.
To simplify all QC procedures with Senso PRO, automated analysis modules have been developed. Without Z-scanning, it can measure heights up to 40 mm in one shot. Over the entire expanded area, it has sub-micron repeatability in height. Lenses that are bi-telecentric and have very little field distortion are used in precise metrology.
