By submitting this form, you are agreeing to the Terms of Use and Privacy Policy.
Coming Soon
Solid-state reactions have been studied for a very long time using time-resolved X-ray diffraction. With the advent of new radiation sources, solid-state processes, phase transitions, and physical changes brought on by disturbances may now be followed in considerably shorter time periods.
The basic characterization of material attributes such crystal structure, crystallite size, and strain is done by X-ray diffraction (XRD).
Because of its numerous applications, XRD is increasingly being used in pharmaceutical research.A potent nondestructive method for characterising crystalline materials is X-ray diffraction (XRD).
It offers details on crystal textures, optimum orientations for crystals, and other structural factors like average grain size, crystallinity, strain, and crystal defects. It also offers details on structures and phases.
The atomic structure of molecules such as powders, tiny molecules, or larger organised molecules like protein crystals can be determined from diffraction patterns.
By keeping an eye on changes in atomic plane separation, it can be utilised to measure strains in materials that are being loaded. It can be challenging to use diffraction to investigate some samples.
The Global time resolved X-ray diffraction (TRXD) market accounted for $XX Billion in 2022 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2023 to 2030.
The most innovative and recent time-resolution X-ray diffractometer (TXRD) on the market is called Rigaku SmartLab.
The new SmartLab Studio II software, which offers the user an intelligent User Guidance expert system functionality that leads the operator through the nuances of each experiment, may be its most innovative feature.
That is similar to having a professional by your side at all times.This new X-ray diffraction system includes the PhotonMax high-flux 9 kW rotating anode X-ray source coupled with a HyPix-3000 high-energy-resolution 2D multidimensional semiconductor detector that supports 0D, 1D, and 2D measurement modes, allowing all applications to be handled with a single detector, eliminating the inconvenience of setting up and switching individual detectors for different applications.
