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Software of this kind, called wafer inspection software, is used to inspect and examine semiconductor wafers used in the production of microelectronics. This software assists in locating flaws and imperfections on the wafer’s surface that could impair the final product’s functionality.
Wafers are inspected using wafer inspection software using a variety of techniques, including optical microscopy, scanning electron microscopy (SEM), and atomic force microscopy (AFM). On the surface of the wafer, defects including fractures, particulates, and contaminants can be found using the software.
To make sure the wafer surface satisfies the necessary requirements, it can also examine the thickness and topography of the wafer surface.
The software is a crucial tool for quality control and assurance and is commonly used in semiconductor production facilities (fabs).
Before the wafers are used in further manufacturing steps, defect-free wafers are checked using wafer inspection software. Early defect detection helps manufacturers avoid producing defective items, which saves time and money.
In the semiconductor industry, wafer inspection software is an essential tool for guaranteeing the quality and dependability of microelectronics.
Global wafer inspection software market accounted for $XX Billion in 2023 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2024 to 2030.
The LS9600 system from Hitachi High-Tech Company is designed to find particulates and flaws on non-patterned wafer surfaces. It has a new short-wavelength, high-output laser that increases throughput at semiconductor device sensitivity.
The Wi8i G2 PRO Wafer Vision Inspection Handler from ViTrox offers great wafer quality and maximum wafer handling flexibility without requiring any machine downtime. Up to 12″ wafers can be handled by the Wi8i G2 PRO.
The EZ300 wafer edge inspection system from Lasertec Corporation uses confocal optics for wafer edge inspection, evaluation, and measurement. The “All in One Idea” is embodied by the EZ300, which encompasses all in-line inspection requirements up to root cause analysis for each type of defect on a single platform.
ProcessGUARD Semiconductor Wafer Defect Inspection Management System, created by Microtronic, is a high volume, high speed semiconductor wafer defect inspection management solution that offers a user-friendly, flexible, and expandable platform. The CIRCL5 system from KLA provides wafer edge defect inspection, profiling, metrology, and other features.
