Multi User License - $2,999
A nondestructive method known as X-ray diffraction analysis (XRD) can give precise details on a material’s crystallographic structure, chemical makeup, and physical characteristics. It is based on the constructive interference of crystalline samples and monochromatic X-rays.
X-rays are electromagnetic radiation with shorter wavelengths that are produced when electrically charged particles with enough energy are slowed down.
In X-ray diffractometry (XRD), the generated X-rays are collimated and directed at a sample of a nanomaterial. The interaction of the incident rays with the sample results in a diffracted ray, which is then recognised, processed, and tallied.
A diffraction pattern is shown by plotting the intensity of the diffracted rays that are scattered over the material at various angles.
Due to the chemistry and atomic organization of the substance, each phase of the material generates a distinct diffraction pattern. A simple addition of the diffraction patterns from each phase creates the diffraction pattern.
The Global X-ray diffraction (XRD) analysis market accounted for $XX Billion in 2021 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2022 to 2030.
Crystalline powders, thin films, epitaxial films, and bulk solid materials can all have their physical and chemical properties measured using the nondestructive analytical approach known as X-ray Diffraction (XRD) via covalent metrology.
High-brilliance Rotating Anode Cu source, Hypix-3000 Hybrid Pixel Array detector, and a selection of high-resolution lenses are the most recent in XRD technologies used at Covalent.
When a crystalline sample is struck by a monochromatic, collimated X-ray beam, the lattice spacings between atomic planes, in accordance with Bragg’s Law, cause constructive interference with the incident beam at specific angles, leading to X-ray diffraction.
The XRD system scans a variety of diffraction angles, producing peaks in the diffraction that can be connected to various families of atomic planes in crystalline specimens.
By examining the XRD peak pattern, one can characterize the crystallite size and microstrain from peak broadening effects, identify and quantify crystalline phases, map the measured lattice parameters in reciprocal space to study pseudomorphic growth of epitaxial films, and calculate residual stress in the material.
Additionally, high-resolution XRD data can be used to do advanced modeling to determine layer composition.
© Copyright 2017-2023. Mobility Foresights. All Rights Reserved.