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A surface-sensitive quantitative spectroscopic method based on the photoelectric effect called X-ray photoelectron spectroscopy (XPS) can identify the elements present in a material (its elemental composition) or that are present on its surface, as well as their chemical state, general electronic structure, and density of the electronic states in the material.
Because it reveals both the elements that are present and the other elements to which they are linked, XPS is a strong measurement technique. The method can be applied to depth profiling when combined with ion-beam etching or to line profiling of the elemental composition throughout the surface.
It is frequently used to examine chemical processes in materials in their raw form or after cleaving, scraping, being exposed to heat, reactive gases, or other physical or chemical changes.
X-ray Photoelectron Spectrometer is a type of photoemission spectroscopy in which an X-ray beam is used to irradiate a material in order to produce electron population spectra. By measuring the kinetic energy and the quantity of expelled electrons, chemical states can be deduced.
Although ambient-pressure XPS, in which materials are evaluated at pressures of a few tens of millibar, is currently under development, it requires high vacuum (residual gas pressure p 106 Pa) or ultra-high vacuum (p 107 Pa).
Except for hydrogen and helium, all elements are easily detected by X-ray Photoelectron Spectrometer When using laboratory X-ray sources. The detection limit is in the parts per thousand range, however long collecting durations and concentration at the top surface can provide parts per million (ppm).
The Global X-ray Photoelectron Spectrometer market accounted for $XX Billion in 2022 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2023 to 2030.
The highest 10 nm of a material’s surface can be analyzed using X-ray photoelectron spectroscopy (XPS), which is unusual in that it can provide quantitative elemental and chemical state information.
The AXIS Supra+ is a market-leading X-ray photoelectron spectrometer that combines the most advanced spectroscopic and imaging capabilities with the highest level of automation currently available. It is also known as Kratos Ultra 2 in Japan.
Photoelectron spectra may be collected from various kinds of materials, including metals, semiconductors, and insulators, thanks to unmatched vast area spectroscopic performance. The lateral distribution of surface chemistry is shown by quick, high spatial resolution XPS imaging, which also helps characterize the surface further with targeted small area analysis.
The AXIS Supra+’s flexible design enables the addition of more surface analysis and surface preparation options without affecting XPS performance. This makes it a priceless asset.
