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Last Updated: Apr 26, 2025 | Study Period: 2023-2030
An analytical tool used to assess the chemical composition of small volumes of solid materials is an electron microprobe (EMP), also known as an electron probe microanalyzer (EPMA) or electron microprobe analyzer (EMPA). Similar to a scanning electron microscope, it works by bombarding the sample with electrons that generate x-rays at wavelengths appropriate for the elements being studied.
When a conventional accelerating voltage of 15-20 kV is applied, this enables the abundances of elements present in small sample sizes (usually 10-30 cubic micrometers or less) to be determined.
Depending on the substance, it is possible to quantify concentrations of elements ranging from lithium to plutonium at as low as 100 parts per million (ppm), though with caution, levels as low as 10 ppm are also feasible. The EPMA method for quantifying lithium became a reality.
The electron microprobe, also called the electron probe micro analyzer, was created using two different technologies: X-ray spectroscopy and electron microscopy.
In electron microscopy, a focused high-energy electron beam is used to interact with a target material. In X-ray spectroscopy, photons produced by the interaction of the electron beam with the target are identified.
The energy and wavelength of the photons are indicative of the atoms that were excited by the incident electrons.
An Auger microprobe is a surface analysis instrument created to analyze the energy levels of Auger electrons stimulated by a sample's electron beam in order to identify the elemental compositions and chemical states in regions a few nanometers deep from the sample surface.

The Global Auger Microprobe market accounted for $XX Billion in 2022 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2023 to 2030.
The JAMP-9500F, made by Jeol USA Inc., has the best spatial resolution an auger microprobe can achieve: (min. probe diameter of 3nm SEI; 8nm for Auger analysis).
The JAMP-9500F achieves extremely small spot sizes with beam currents up to 200nA by using a low-aberration condenser lens (in which an electrostatic field and a magnetic field are superimposed) and a patented "in-lens" Schottky field emission gun.
| Sl no | Topic |
| 1 | Market Segmentation |
| 2 | Scope of the report |
| 3 | Abbreviations |
| 4 | Research Methodology |
| 5 | Executive Summary |
| 6 | Introduction |
| 7 | Insights from Industry stakeholders |
| 8 | Cost breakdown of Product by sub-components and average profit margin |
| 9 | Disruptive innovation in the Industry |
| 10 | Technology trends in the Industry |
| 11 | Consumer trends in the industry |
| 12 | Recent Production Milestones |
| 13 | Component Manufacturing in US, EU and China |
| 14 | COVID-19 impact on overall market |
| 15 | COVID-19 impact on Production of components |
| 16 | COVID-19 impact on Point of sale |
| 17 | Market Segmentation, Dynamics and Forecast by Geography, 2023-2030 |
| 18 | Market Segmentation, Dynamics and Forecast by Product Type, 2023-2030 |
| 19 | Market Segmentation, Dynamics and Forecast by Application, 2023-2030 |
| 20 | Market Segmentation, Dynamics and Forecast by End use, 2023-2030 |
| 21 | Product installation rate by OEM, 2023 |
| 22 | Incline/Decline in Average B-2-B selling price in past 5 years |
| 23 | Competition from substitute products |
| 24 | Gross margin and average profitability of suppliers |
| 25 | New product development in past 12 months |
| 26 | M&A in past 12 months |
| 27 | Growth strategy of leading players |
| 28 | Market share of vendors, 2023 |
| 29 | Company Profiles |
| 30 | Unmet needs and opportunity for new suppliers |
| 31 | Conclusion |
| 32 | Appendix |