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A microbeam instrument known as an electron probe micro-analyzer is primarily utilized for the in-situ, non-destructive chemical analysis of minute solid samples.
Informally, EPMA is also known as a probe or electron microprobe. Chemical analysis is now available on top of the basic SEM capabilities.
An EPMA’s primary function is to conduct precise, quantitative elemental analyses using wavelength-dispersive spectroscopy (WDS) at extremely small “spot” sizes (as little as 1-2 microns).
Geological materials can be analyzed in situ and complex chemical variation within single phases (primarily glasses and minerals in geology) can be resolved thanks to the spatial scale of analysis and the ability to create detailed images of the sample.
Features that are unresolvable under a light microscope can easily be imaged to study detailed microtextures or provide the fine-scale context of an individual spot analysis because the electron optics of an SEM or EPMA allow much higher resolution images to be obtained.
TheGlobal Electron Probe Microanalyzer (EPMA) market accounted for $XX Billion in 2022 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2023 to 2030.
SXFive-TACTIS, the latest addition to the CAMECA line of high-end microanalytical instruments and the only Electron Probe Microanalyzer (EPMA) in the world with a touch-screen interface, is now available from CAMECA, a world leader in scientific instrumentation and metrology solutions.
SXFive-TACTIS is a revolutionary dual interface electron probe microanalyzer that combines all of the best features of CAMECA’s earlier models.
It is intended to fulfill a developing need from multiuser research offices for instrumentation that consolidates exceptionally modern logical choices no sweat of purpose.
Users of SXFive-TACTIS can select between two modes of tool operation. A new, user-friendly touch-screen interface with a wealth of simplified options makes instrument configuration and operation, as well as basic imaging and data processing, simple in beginner mode.
The interface in expert mode is made for skilled users who can take advantage of a wide range of tool parameters and software options.
An additional backscattered electron (BSE) detector for improved imaging, particularly at low voltage, is one of the SXFive-TACTIS’s other technological advancements.
a hyper-mapping module for energy dispersive spectroscopy (EDS) that is fully integrated for fast quantitative analysis; and the capacity to obtain X-ray images using EDS and wavelength dispersive spectroscopy (WDS) in real time.
The instrument can be completely remote controlled, permitting clients to run tests from their PDAs, tablets or any far off PC.
A W, LaB6, or field-emission source is available for the new EPMA platform. EPMA capabilities have been expanded to smaller analyzed volumes thanks to CAMECA’s optimization of performance for difficult microanalytical applications at sub-micron spatial resolution.
The SXFive-TACTIS provides the highest quality minor and trace element analysis, addressing the most challenging analytical tasks in mineralogy, geochronology, ore discovery, nuclear science, and research in materials, metals, thin films, and semiconductors.
It is also outfitted with high-precision spectrometers for maximum reproducibility.
