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The EMC probes are employed in the vicinity of electromagnetic radiation sources and are utilised to find and pinpoint potential sources of interference inside the constituent parts of electronic assemblies.
The EMC probes function like broad-band antennas, picking up radiated emissions from parts, PCB traces, housing apertures or gaps, and from any other parts that might be generating RF.Its slim design makes it possible to reach components with little space.
You can prevent picking up common mode noise by using shielded loops, range of frequencies up to 6 GHz .It has a rubber coating to insulate it.
The Global EMC near field probes market accounted for $XX Billion in 2021 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2022 to 2030.
E-Field Probe Sniffer Probes, a patented product .The PS-400 Near Field Probe set is intended to aid in EMI problem diagnosis at both the board and component levels. It may be used to find radiation coming from traces, cables, cases, and ICs. The general area of emission is often located using the broadband probe.
In order to narrow the source down to a particular trace or pin, the tip probe is next employed. Using the contact tip probe (included with the PS-500 probe set), additional analysis can be carried out by making direct contact with the circuit and then tracing the noisy trace to identify the source of emissions, such as a damaged transmission line or impedance mismatch.
The H-field probe is frequently used to check the stability of your computer’s chassis. The probe is moved along the chassis seams, which may also serve as slot antennas, to accomplish this. This probe can also be highly helpful for finding magnetic noise sources like transformers or heavy current switching circuits.
The developer can precisely locate RF sources of between 1 GHz and 10 GHz on tightly packed printed circuit boards or on IC pins thanks to the new SX probe heads’ excellent measurement resolution. The EMC near-field probes from Langer EMV-Technik GmbH’s simple compact pin shape offer the developer practical working circumstances on the corresponding PCB.
High clock rates, like 2 GHz, can produce 5th order harmonics that can reach 10 GHz. On the PCB, RF sources like conductor sections, ICs, and other parts couple out these harmonics. They might cause the PCB’s other structural elements to vibrate and release emissions. Due to the high internal fundamental frequency of contemporary PCBs, measuring its harmonics is a crucial step in achieving reliable EMC. Three near-field probes with excellent resolution for measurements in the higher frequency range are included in the new SX1 near-field probe set.
The SX-E 03 is an E-field probe for frequencies between 1 GHz and 10 GHz, and it has an electrode with a roughly 4 x 4 mm dimension on the underside of the probe head. Small E-field sources like cables, specific parts on a printed circuit board, etc. can be located using this probe. Typically, the near-field probe’s head is placed immediately on the measuring object (high electric field strength).
The SX-R 3-1 is an H-field probe with a very small probe head for frequencies between 1 GHz and 10 GHz that can detect interference from even the tiniest parts. This tiny probe head is also perfect for doing measurements in confined spaces, such as close to IC pins.
Magnetic field lines that radiate outward in an orthogonal direction from the measuring item are picked up by the SX-R 3-1. Sideways entering magnetic field lines into the probe are not picked up.
When the probe head is held vertically, it is affixed to the probe shaft and so sits directly on the surface of the printed circuit board. This makes it possible to perform measurements, for instance, between big chunks of switching controllers.
The SX family of near-field probes are passive probes. They are portable and useful. Sheath currents are reduced and the magnetic field probes are electrically insulated. In the SX-E 03 electric field probe, the upper side of the probe head is electrically protected. A shielded cable and SMA connection are used to connect the near-field probes to the 50 input of a spectrum analyzer or oscilloscope during the measurement. There is an inbuilt terminating resistor in the near-field probes.
