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RF, MEMS, mixed-signal, and other analog semiconductor components can be tested with this high-density source measure unit (SMU), which has six times the DC channel density of previous NI PXI SMUs.
In a form factor that is ready for production, SMU offers higher DC channel density for increased parallelism in multisite applications and laboratory-grade measurement quality.
“Exceptionally problematic innovations like 5G, the Web of Things and independent vehicles put a strain on semiconductor associations to develop and take on additional proficient ways to deal with semiconductor tests – from the lab climate to the creation floor,”
“Semiconductor test is an essential concentration for NI. In order to assist chipmakers in addressing their most pressing issues, we are expanding the capabilities of our software platform and PXI, as demonstrated by our most recent PXI SMU.
In the validation lab and on the production floor, engineers can use the same instrumentation, reducing measurement correlation difficulties and speeding up time to market.
The Global High Density SMU market accounted for $XX Billion in 2023 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2024 to 2030.
The PXIe-4163 high-density source measure unit (SMU), which has six times the DC channel density of previous NI PXI SMUs and is used to test analog semiconductor components for RF, MEMS, mixed-signal, and other applications.
Semiconductor Test System (STS) has been quickly adopted by chipmakers due to its throughput, cost-effective performance, and production floor footprint.
These capabilities are further enhanced by the brand-new PXIe-4163 SMU. In a form factor that is ready for production, it provides higher DC channel density for increased parallelism in multisite applications and laboratory-grade measurement quality.
Designers can exploit this blend to involve a similar instrumentation in the approval lab and the creation floor, which decreases difficulties with estimation relationship and abbreviates time to showcase.
