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The logic probe, also known as a digital tester, is often a portable, inexpensive probe that resembles a pen and has indicator lights to represent the status of the line being probed. simple probe tester for logic. Logic probes are frequently used to test digital circuits, such as those that employ TTL or CMOS logic.
An inexpensive hand-held test probe called a logic probe is used to examine and troubleshoot the logical states of a digital circuit. A microchip used to test a circuit’s signals is called a probe card. A probe head is a piece of equipment used to attach the microchips to the semiconductor testing apparatus.
The Global Logic Test Probe Card Market accounted for $XX Billion in 2023 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2024 to 2030.
SV Probe launches memory and logic probe cards. Manufacturer SV Probe claims that their SureTouch single-touchdown memory probe card and LogicTouch fine-pitch vertical probe card both seek to deliver greater testing performance at a cheaper total cost of ownership.
Prior to being sliced, packaged, and built into electronic products like mobile phones, computers, and digital media players, semiconductor wafers must undergo electrical testing using probe cards.
SureTouch, which targets NAND flash memory, allows testing of all devices on the wafer using just one contact rather than several step contacts as with other standard test products.
It is positioned to meet the demand for NAND flash memory that requires high parallelism testing, quick manufacturing lead times, and lower total cost of ownership.
LogicTouch is a MEMS-based fine-pitch vertical probe card for high-performance mixed-signal and logic devices, such as microprocessors, digital signal processors, and system-on-chip integrated circuits (ICs), that demand high parallelism testing and device adjacent pad pitch of 60 microns and below.
The manufacture of essential probe card parts, like probe pins, for MEMS-based cards uses photolithographic technology. Increased pad density, smaller chip pad geometries, and parallel testing are made possible by it for manufacturers of probe cards.
STAr Technologies launched a new line for assembling probe cards. In addition to maintenance duties, a probe card assembly line was constructed to meet the rapidly expanding regional semiconductor test requirements and boost customer service productivity.
In the semiconductor business, STAr Technologies has established a reputation as a leader in test solutions and services and gained the confidence of its clients. STAr Tainan Office, which began operations, has made remarkable strides in local commerce and customer service.
The sales volume of the Tainan Office has continued to increase since its relocation to the Southern Taiwan Science Park, driving the plan to move and build up a new probe card assembly line and maintenance facility this year.
The new office makes it possible to offer more effective and reasonably priced test goods and services to customers in the local industry thanks to better space and labour allocation and full equipment utilisation. Tainan Office’s expansion can be credited to the support of the industry’s clients and the efforts of all workers.
The new assembly line and maintenance service centre demonstrate how STAr Technologies’ business philosophy is put into practise. They always aim for “Customer Satisfaction” as the goal. They think it will eventually result in a win-win situation for business and their clients.
Probe Test Solutions Ltd. (PTSL), an established, fast-growing company that is a global leader in providing advanced ATE test hardware solutions, unveils its entry into the RF Probe Card market with the introduction of the first device from a planned family of products, showcasing the highest performance signal integrity RF probe card solution available .
The PhazorRF product line will focus on 5G and 6G applications, as well as the next generation of automobile radar. They are currently announcing the release of the PhazorRF product family and their strategic entry into the RF probe card market, less than a year after closing a round of funding and buying ThinkMEMS.
High device measurement precision is possible thanks to PhazorRF’s ultra-low loss, high bandwidth probe, from characterisation through full ATE manufacture. PhazorRF is applicable for a variety of applications, from advanced high pin count AI processors to automotive and RF mobile chipsets, thanks to its programmable tip shapes and finishes.
PhazorRF probes have better mechanical durability and are built for steady contact over a long lifetime in addition to having better electrical performance.
PhazorRF also solves the issue of testing over a wide bandwidth or high frequency range, while retaining high production throughput with increased levels of parallelism, for both engineering characterization and volume manufacturing.
