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Last Updated: Apr 25, 2025 | Study Period: 2024-2030
A photomask is created by writing or exposing the designer's pattern onto a blank chrome mask with a resist coating. The resist latent image is developed to create the necessary pattern. As the etching procedure is being done, this resist image serves as a mask.
A photomask is a production tool for parts like displays, PCBs, MEMS, and electronic devices (semiconductors). It serves as the patterning's master copy. In order to create PCB circuitry and display patterns, photolithography is utilised.
The baseplate patterns are transferred using photomasks.A computer-aided design (CAD) is translated to a thin (80â100 nm) layer of metal in a glass or fused silica substrate, known as a mask or photomask, during the fabrication process of masks.
The Global Photomask Fabrication System Market accounted for $XX Billion in 2022 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2023 to 2030.
Park Systems Introduces Park NX-Mask, a Photomask Repair for EUV and In-Line Park Systems, a global leader in the production of Atomic Force Microscopes, introduced Park NX-Mask, the most effective, secure, and practical new generation photomask repair apparatus.
Inline manufacture of EUV masks is supported by Park NX-Mask's optimised solutions, which support twin pods. From reviewing vehicle faults to fixing them and verifying the fixes, it offers a comprehensive solution that speeds up throughput while achieving previously unheard-of repair efficacy.
The most sophisticated photomask repair solution for high-end EUV semiconductor manufacturing, as well as for R&D and mask shops, is Park NX-Mask, which is based on AFM technology. Additionally, Richard Lee, Head of Product Marketing Division at Park Systems, noted that it is the most reasonably priced system on the market.
By eliminating imperfections and unwanted particles with nanoscale accuracy and angstrom level edge-placement precision, Park NX-Mask can repair even the most difficult photomasks.
It accomplishes this without affecting the reflecting surface pattern or erroneous dépôts, such as stains and inserted parts.
Park NX-Mask includes automatic defect evaluation as standard, which is useful for EUV mask reticles since it offers fast throughput, high resolution, and is free from the harmful dangers associated with other techniques like e-beam and laser.
Additionally, Park NX-Mask provides a completely automated AFM nano-metrology for pattern step height and surface roughness. It accomplishes this in non-contact scanning mode with sub-angstrom vertical accuracy.
Sl no | Topic |
1 | Market Segmentation |
2 | Scope of the report |
3 | Abbreviations |
4 | Research Methodology |
5 | Executive Summary |
6 | Introdauction |
7 | Insights from Industry stakeholders |
8 | Cost breakdown of Product by sub-components and average profit margin |
9 | Disruptive innovation in theIndustry |
10 | Technology trends in the Industry |
11 | Consumer trends in the industry |
12 | Recent Production Milestones |
13 | Component Manufacturing in US, EU and China |
14 | COVID-19 impact on overall market |
15 | COVID-19 impact on Production of components |
16 | COVID-19 impact on Point of sale |
17 | Market Segmentation, Dynamics and Forecast by Geography, 2023-2030 |
18 | Market Segmentation, Dynamics and Forecast by Product Type, 2023-2030 |
19 | Market Segmentation, Dynamics and Forecast by Application, 2023-2030 |
20 | Market Segmentation, Dynamics and Forecast by End use, 2023-2030 |
21 | Product installation rate by OEM, 2023 |
22 | Incline/Decline in Average B-2-B selling price in past 5 years |
23 | Competition from substitute products |
24 | Gross margin and average profitability of suppliers |
25 | New product development in past 12 months |
26 | M&A in past 12 months |
27 | Growth strategy of leading players |
28 | Market share of vendors, 2023 |
29 | Company Profiles |
30 | Unmet needs and opportunity for new suppliers |
31 | Conclusion |
32 | Appendix |