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Last Updated: Apr 25, 2025 | Study Period: 2023-2030
The analytical method known as Rutherford backscattering spectroscopy (RBS) is employed in the field of materials research. RBS, also known as high-energy ion scattering (HEIS) spectroscopy, analyses the backscattering of a beam of high energy ions (usually protons or alpha particles) impinging on a sample to ascertain the structure and composition of materials.
In honour of Lord Rutherford, a physicist commonly referred to as the "father of nuclear physics," Rutherford backscattering spectroscopy bears his name.
Hans Geiger and Ernest Marsden conducted a number of experiments under Rutherford's supervision to explore the scattering of alpha particles through metal foils.
Backscattering of the high-energy positive alpha particles should have been nonexistent according to the then-dominant plum-pudding model of the atom, in which minuscule negative electrons were dispersed over a diffuse positive region.
The alpha particles should flow through the foil with just minor deflections at most. Marsden found a distinct backscattered signal as soon as he placed the detector on the same side of the foil as the alpha particle source.
Rutherford backscattering is defined as the elastic, hard-sphere impact between a projectile with high kinetic energy from the incident beam and a stationary particle inside the sample (the target).
When referring to elastic collisions, it is meant that no energy is transmitted from the incident particle to the stationary particle and that the stationary particle's state is not altered.
The Global Rutherford backscattering spectroscopy market accounted for $XX Billion in 2022 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2023 to 2030.
Rutherford Backscattering spectroscopy (RBS), developed by Infinita Lab, is a non-destructive elemental analysis method widely applied to thin-film semiconductor material stacks.
It is frequently employed for near-surface layer examination of the samples, depth profiling of certain elements, and quantitative compositional analysis of the sample.
The quality of single-crystal substrate samples can also be evaluated using this information. Films can be characterised using depth profiling up to samples with a thickness of less than 1 m.
The positively charged atoms in the sample act as a repellent to the high-energy helium ions used in this RBS test, which are normally focused at a sample at energies between 0.5 and 4 MeV.
To determine the elemental composition and depth profile, a solid-state detector detects the energy distribution and yield of backscattered ions from the sample.
Sl no | Topic |
1 | Market Segmentation |
2 | Scope of the report |
3 | Abbreviations |
4 | Research Methodology |
5 | Executive Summary |
6 | Introduction |
7 | Insights from Industry stakeholders |
8 | Cost breakdown of Product by sub-components and average profit margin |
9 | Disruptive innovation in the Industry |
10 | Technology trends in the Industry |
11 | Consumer trends in the industry |
12 | Recent Production Milestones |
13 | Component Manufacturing in US, EU and China |
14 | COVID-19 impact on overall market |
15 | COVID-19 impact on Production of components |
16 | COVID-19 impact on Point of sale |
17 | Market Segmentation, Dynamics and Forecast by Geography, 2023-2030 |
18 | Market Segmentation, Dynamics and Forecast by Product Type, 2023-2030 |
19 | Market Segmentation, Dynamics and Forecast by Application, 2023-2030 |
20 | Market Segmentation, Dynamics and Forecast by End use, 2023-2030 |
21 | Product installation rate by OEM, 2023 |
22 | Incline/Decline in Average B-2-B selling price in past 5 years |
23 | Competition from substitute products |
24 | Gross margin and average profitability of suppliers |
25 | New product development in past 12 months |
26 | M&A in past 12 months |
27 | Growth strategy of leading players |
28 | Market share of vendors, 2023 |
29 | Company Profiles |
30 | Unmet needs and opportunity for new suppliers |
31 | Conclusion |
32 | Appendix |