By submitting this form, you are agreeing to the Terms of Use and Privacy Policy.
A parameter analyzer is a fundamental tool for measuring the properties of semiconductor devices. In simple terms, the analyzer is a collection of high precision sources and meters along with some dedicated software to control the measurements and present the measured data.
The sources and meters can be configured in a number of ways to perform whatever types of measurements are needed to characterize a semiconductor device (diode, transistor, or whatever).
Using the parameter analyzer is a bit like using Signal Express to automate measurements with the sources and meters on the lab bench, except that the sources and meters of the analyzer offer much higher precision.
Also, since the parameter analyzer is dedicated to semiconductor device characterization, many of the more commonly used measurement routines are pre-programmed. In measuring the diodes and transistors, we will make use of these of “canned” programs.
The semiconductor parameter analyzer is an all-in-one unit, that consists of a power supplies, voltage meters, current meters, switching matrices and LCR meters to test semiconductors.
Conduct both current-voltage and capacitance measurements with just a semiconductor parameter analyzer.
The Global Semiconductor Parameter Analyzer Market accounted for $XX Billion in 2023 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2024 to 2030.
Keithley 4200A-SCS Parameter Analyzer – Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200A-SCS.
The highest performance parameter analyzer, it delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements.
The new 4201-SMU and 4211-SMU are designed specifically for test setups with long cables, switch matrices, gate contacts to the chuck, and other fixturing.
Such test setups, which are required in a number of low current measurement applications, can increase the capacitance seen at the output of the SMU, even though the device under test itself has very low capacitance.
When the test connection capacitance is too high, the resulting low current measurements can become unstable.
To address these challenges, the new modules can source voltage and measure current with longer cables or more connection capacitance than possible using traditional SMUs.
This saves researchers and manufacturing test engineers the time and cost that would otherwise be spent troubleshooting and reconfiguring test setups.
