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A focused primary ion beam is used to sputter the surface of the specimen in secondary-ion mass spectrometry, which then collects and examines the secondary ions that are expelled. This method is used to determine the composition of solid surfaces and thin films.
In order to estimate the elemental, isotopic, or molecular composition of the surface to a depth of 1 to 2 nm, the mass/charge ratios of these secondary ions are analysed with a mass spectrometer.
Since the ionisation probabilities of the elements spat from various materials vary greatly, comparison to properly calibrated standards is required to produce precise quantitative data. The most sensitive surface analysis method is SIMS, with part per million to part per billion limits for elemental detection.
There are three basic analyzers that are available depending on the SIMS type:quadrupole, sector, and time-of-flight. The secondary ions are separated by their mass-to-charge ratio using an electrostatic analyzer and a magnetic analyzer in a sector field mass spectrometer.
Only the chosen masses can pass through the resonant electric fields that separate the masses in a quadrupole mass analyzer. The ions are separated by the time of flight mass analyzer over a field-free drift path. While all ions have the same amount of kinetic energy, the period of flight and velocity vary with ion mass.
It calls for either pulsed main ion gun or pulsed secondary ion extraction for the formation of pulsed secondary ions. It is the only type of analyzer capable of concurrently detecting all secondary ions produced.
The Global SIMS analyzer Market accounted for $XX Billion in 2023 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2024 to 2030.
For high performance dynamic and static SIMS analysis, Hiden Analytical launched incredibly flexible, high-sensitivity equipment, unlocking new levels of precision in cutting-edge applications.
The SIMS workstation is an all-inclusive solution for applications requiring depth profiling and composition analysis due to its expanded range and capacity to acquire and distinguish between positive and negative secondary ions.
Hiden Analytical has also created the ground-breaking Hi5 SIMS workstation for simultaneous +ve and -ve ion analysis in a complete SIMS package. One of the most sensitive methods ever created for examining a material’s highest surface layers, from depths of several hundred nanometers to a single atomic layer, is secondary ion mass spectrometry, or SIMS.
