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A printed circuit board (PCB) or electronic components insulation layer resistance is measured using the Insulation Resistance testing procedure.
During the test, the insulation’s electrical resistance is measured, and the results reveal the insulation’s dependability and quality.
A device that applies a high voltage to the PCB or component and monitors the current that travels through the insulating material is a part of the SIR testing system.
SIR testing is done to make sure the insulating layer is strong enough to guard against electrical shorts and maintain the component or PCB’s dependability.
To make sure the insulation is within acceptable limits, this kind of testing is often carried out during the production process, prior to the component being integrated into a finished product. To decide if a component is suitable for inclusion in the finished product, the SIR test results are consulted.
The Surface Insulation Resistance (SIR) Testing System accounted for $XX Billion in 2023 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2024 to 2030.
With the SE500, a new SIR testing equipment from CyberOptics, printed circuit boards’ insulation resistance can now be measured quickly, accurately, and consistently.
In order to increase test efficiency and accuracy, KVMS has unveiled the K-SIR, a new SIR testing system.
The KY8050, the newest SIR testing equipment from Koh Young Technology, is now available and delivers superior and elevated evaluations of insulation resistance for a variety of electronic equipment.
The LSIR-360, the newest SIR testing equipment from Lumentum, offers quick and precise measurements of insulation resistance for a variety of electrical devices.
The UltraFLEX, a new SIR testing system from Teradyne, boasts cutting-edge hardware and software capabilities for greater test accuracy and effectiveness.
The V93000, the newest SIR testing equipment from Advantest, provides high-speed, high-precision insulation resistance measurements for a wide range of electrical devices.
