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Last Updated: Apr 25, 2025 | Study Period: 2024-2030
The wafer defect detection system finds physical defects (also known as foreign materials or particles) and pattern defects on wafers while also determining their position coordinates (X, Y). Systematic and random defects are two categories of flaws.
Device encapsulation and wafer fabrication processes are combined in wafer level packaging (WLP). With the aid of suitable connecting techniques (such TSV or metal bumps), numerous ICs can be stacked together utilising the chip-scale packaging method known as WLP.
Unmatched accuracy and dependability in a vision algorithm for examining wafer level chip scale packaging. It guarantees that only devices that satisfy the required quality standards are placed into the output reels, ready for the following process step, with the help of a sophisticated vision-guided pick and place transfer.
The user-friendly interface of tSort, which makes use of cutting-edge robotic motion control technology, makes it a really resilient solution for the demanding production environments of today.
Global wafer level packaging inspection systems market accounted for $XX Billion in 2023 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2024 to 2030.
Artificial intelligence (AI)-enhanced semiconductor packaging inspection solutions have been released by KLA, the business announced.
They are the next-generation ICOS T3/T7 Series of packaged integrated circuit (IC) component inspection and metrology systems, the ICOS F160XP die sorting and inspection system, and the Kronos 1190 wafer-level packaging inspection system.
According to the manufacturer, the Kronos 1190 wafer inspection system makes use of high-resolution optics to give inline process control for sophisticated wafer-level packing process stages as features contract and patterns thicken.
In order to improve quality control and yield learning, the recently released Design Wise solution uses AI to guarantee that faults are accurately discovered and sorted.
The new IR2.0 inspection module, which combines optical and real IR side inspection and doubles the throughput for 100% IR inspection over the previous generation, is part of the ICOS F160XP system.
Their improved algorithms, higher sensitivity, and throughput solve the challenges posed by 3D structures, heterogeneous integration, and decreasing feature sizes.
Wafer-level packages are examined and diced before inspection and die sorting are carried out using the ICOS F160XP system.
Sl no | Topic |
1 | Market Segmentation |
2 | Scope of the report |
3 | Abbreviations |
4 | Research Methodology |
5 | Executive Summary |
6 | Introduction |
7 | Insights from Industry stakeholders |
8 | Cost breakdown of Product by sub-components and average profit margin |
9 | Disruptive innovation in the Industry |
10 | Technology trends in the Industry |
11 | Consumer trends in the industry |
12 | Recent Production Milestones |
13 | Component Manufacturing in US, EU and China |
14 | COVID-19 impact on overall market |
15 | COVID-19 impact on Production of components |
16 | COVID-19 impact on Point of sale |
17 | Market Segmentation, Dynamics and Forecast by Geography, 2024-2030 |
18 | Market Segmentation, Dynamics and Forecast by Product Type, 2024-2030 |
19 | Market Segmentation, Dynamics and Forecast by Application, 2024-2030 |
20 | Market Segmentation, Dynamics and Forecast by End use, 2024-2030 |
21 | Product installation rate by OEM, 2023 |
22 | Incline/Decline in Average B-2-B selling price in past 5 years |
23 | Competition from substitute products |
24 | Gross margin and average profitability of suppliers |
25 | New product development in past 12 months |
26 | M&A in past 12 months |
27 | Growth strategy of leading players |
28 | Market share of vendors, 2023 |
29 | Company Profiles |
30 | Unmet needs and opportunity for new suppliers |
31 | Conclusion |
32 | Appendix |