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For the characterization of thin films and multi-layer semiconductor systems, ellipsometry is a potent technique. Observing the phase change of a light beam passing through a layer structure is how the method operates.
With the highly sensitive method of spectroscopic ellipsometry, it is not necessary to know the light’s exact intensity to estimate the phase angle.
A non-destructive, non-contact, and non-invasive optical technique called spectroscopic ellipsometry is based on how the polarisation state of light changes as it is reflected obliquely off a thin film sample.
There are several methods for spectroscopic examination, such as energy dispersive X-ray spectroscopy (EDX, attached to SEM or TEM), electron spectroscopy for chemical analysis (ESCA, also known as XPS), Fourier transform infrared (FT-IR) and Raman spectroscopies, ultraviolet spectroscopy, and others (UV)
The Global Spectroscopic Ellipsometer market accounted for $XX Billion in 2022 and is anticipated to reach $XX Billion by 2030, registering a CAGR of XX% from 2023 to 2030.
The launch of the UVISEL 2, a new generation of scientific spectroscopic ellipsometers, has been announced by Horiba Scientific, a world authority with years of experience in phase modulation ellipsometry technology.
The UVISEL 2 is a fully automated platform with a patented vision system, eight computer-selectable achromatic spot sizes, and fast scanning, high-resolution monochromators, making it a one-of-a-kind method for effectively and quickly characterising thin films over a wide spectral range of 190-2100 nm.
With its automatic goniometer, automatic XYZ stage, automatic sample adjustment, and automatic microspot optics, the UVISEL 2 is a highly automated device.
Microspots enable simple and precise spot positioning on a sample when used in conjunction with a real-time vision system.
The user can conduct measurements on a wide spectral range even with a small spot size thanks to a choice of eight achromatic spots that are available (down to 35 m).
On any surface, whether rough, smooth, clear, or reflecting, an image may always be obtained thanks to this special technique.
The upgraded electronics and a strong phase modulation control make the UVISEL 2 the most sensitive and precise spectroscopic ellipsometer on the market.
It can identify complex optical and material features (such as anisotropy and gradient), find incredibly thin layers (like graphene), and track extremely quick kinetic processes at a rate of up to 1 ms per spot.
The VIS-FUV and NIR detection technologies have also been improved to offer very little stray light and quicker acquisition.
